TA Instruments, Inc. v. Perkin-Elmer Corp.

277 F. Supp. 2d 367, 2003 WL 21843361
CourtDistrict Court, D. Delaware
DecidedJuly 31, 2003
DocketCIV.A.95-545-SLR
StatusPublished

This text of 277 F. Supp. 2d 367 (TA Instruments, Inc. v. Perkin-Elmer Corp.) is published on Counsel Stack Legal Research, covering District Court, D. Delaware primary law. Counsel Stack provides free access to over 12 million legal documents including statutes, case law, regulations, and constitutions.

Bluebook
TA Instruments, Inc. v. Perkin-Elmer Corp., 277 F. Supp. 2d 367, 2003 WL 21843361 (D. Del. 2003).

Opinion

AMENDED OPINION*

ROBINSON, Chief Judge.

I. INTRODUCTION

On September 7, 1995, plaintiff TA Instruments, Inc. (“TA”) filed this action against defendant The Perkin-Elmer Corporation (“PE”), alleging infringement of certain claims of United States Patent Nos. 5,224,775 (the “ ’775 patent”), 5,346,-306 (the “ ’306 patent”), and 5,439,291 (the “’291 patent”) (collectively, the “TA patents”). Generally speaking, these patents disclose an analytical technique using a differential scanning calorimeter whereby a material is driven through a transition by an independent physical parameter, such as temperature, in order to study the material’s properties.

PE counterclaimed alleging infringement of certain claims of United States Patent No. 4,246,641 (the “ ’641 patent”). The ’641 patent covers a device for heating and cooling a sample to a desired temperature.

The TA patents were previously found to be infringed by PE’s products. The parties tried the issues of damages for the infringement of the TA patents and infringement of claim 1 of the ’641 patent to a jury in September 2002. Currently before the court are the parties’ post-trial motions.

II. BACKGROUND

A. The ’641 Patent

The ’641 patent, entitled “Automatic Temperature Calibration of Temperature Analyzers,” issued on January 20, 1981. The named inventors are Simon Babil and Andrew R. Muir. The listed assignee is The Perkin-Elmer Corporation.

As interpreted by the Federal Circuit, the ’641 patent (also known as “the Babil patent”) discloses the following invention:

The Babil patent is directed to a device for heating or cooling a sample to a desired temperature. The Babil device ensures that the sample experiences the precise temperature that is selected. See Babil pat., col. 1., 11. 38-43. The invention automatically calibrates temperature so that the sample temperature is the same as the selected temperature across a range of temperatures. See id.
The specification of the Babil patent describes the calibration process as follows: The device calibrates temperature at three temperatures (the “calibration temperatures”) within the temperature range that is going to be used. See id. at col. 1,11. 49-53. For each of the three temperatures, the device is commanded to reach the selected temperature and permitted to stabilize. Then, the device calculates the difference between the sample temperature and the selected temperature, and uses this difference to calculate an adjusted temperature. The device is then commanded to reach the adjusted temperature and is permitted to stabilize. The device calculates the difference between the sample temperature and the original selected temperature, and uses the difference to calculate a new adjusted temperature. This process is repeated until the sample temperature is the same as the selected temperature. The difference between the selected temperature and the adjust *370 ed temperature needed to obtain this result (the “correction factor”) is stored in a computer memory. See id. at col. 1, 1. 53 — col. 2,1. 8, col. 3,1. 24 — col. 4,1.19. The circuitry shown in Figure 1 of the patent performs this calibration process.
According to the specification, after calibration has been completed, the correction factors are used to calculate the temperature which the device must be commanded to reach (the “corrected temperature”) in order to ensure that the sample experiences the selected temperature across the range of temperatures that is going to be used. See id. at col. 5, 11. 22-25. Thus, the correction factors obtained for the three calibrated temperatures are used to calculate the corrected temperatures for all of the selected temperatures. The parties refer to the process of using the stored correction factors to calculate a corrected temperature for a selected temperature as “interpolation.” The device shown in Figure 3 of the Babil patent, which includes the circuitry of Figure 1, a memory, and a processor for performing interpolation, performs this interpolation process.

TA Instruments, Inc. v. The Perkin-Elmer Corporation, No. 00-1358, 2000 WL 717094, at *13 (Fed.Cir. June 1, 2000).

PE asserted infringement of claim 1 of the ’641 patent.

Claim 1 of the ’641 patent recites:

1. A thermal analysis system for heating or cooling a test sample to one or more temperatures within a predetermined temperature scale, comprising in combination:
an oven,
a sample disposed in said oven,
first means providing a signal proportional to the temperature of said sample,
second means providing a signal proportional to the temperature of the oven including heater means for raising the temperature of the oven,
computer means disposed between said first and second means for correcting automatically for discrepancies between oven temperatures and desired sample temperatures.

(’641 patent, col. 6, Ins. 17-30)

The court construed the “computer means” limitation, the sole disputed term of claim 1 of the ’641 patent. The court’s construction, adopted from the Federal Circuit’s claim construction opinion, recited:

The computer means limitation is a means-plus-function clause, meaning that the limitation only covers the structures described in the specification and drawings that perform the claimed function and equivalents thereof. The structure that performs the function of correcting automatically for discrepancies between oven temperatures and desired sample temperatures, as described in the specification of the ’641 patent, is the automatic calibration means shown in Figure 1. This structure cycles the device through the steps of commanding the oven to reach a selected temperature, permitting the sample temperature to stabilize, and comparing the sample temperature to the selected temperature, etc., until the sample temperature reaches the selected temperature. This structure corrects automatically for discrepancies between oven temperatures and desired sample temperatures by adjusting the temperature the oven is commanded to reach until the sample experiences the selected temperature.

(D.I. 509 at 1839-40)

B. The Accused Product

PE alleged that TA’s thermal analysis instruments with the “isotrack” mode of operation infringe claim 1 of its ’641 *371 patent. The isotrack software program operates to control the thermal analysis instrument to ensure that the sample experiences the selected temperature. First, the oven is commanded to reach the selected temperature. Next, the system waits until the sample temperature has stabilized. Then, the system determines the difference between the sample temperature and the selected temperature.

Free access — add to your briefcase to read the full text and ask questions with AI

Related

Allied Chemical Corp. v. Daiflon, Inc.
449 U.S. 33 (Supreme Court, 1980)
Southwall Technologies, Inc. v. Cardinal Ig Company
54 F.3d 1570 (Federal Circuit, 1995)
Intergraph Corporation v. Intel Corporation
253 F.3d 695 (Federal Circuit, 2001)
Zarow-Smith v. New Jersey Transit Rail Operations, Inc.
953 F. Supp. 581 (D. New Jersey, 1997)
LifeScan, Inc. v. Home Diagnostics, Inc.
103 F. Supp. 2d 345 (D. Delaware, 2000)
Dawn Equipment Co. v. Kentucky Farms Inc.
140 F.3d 1009 (Federal Circuit, 1998)
Pannu v. Iolab Corp.
155 F.3d 1344 (Federal Circuit, 1998)

Cite This Page — Counsel Stack

Bluebook (online)
277 F. Supp. 2d 367, 2003 WL 21843361, Counsel Stack Legal Research, https://law.counselstack.com/opinion/ta-instruments-inc-v-perkin-elmer-corp-ded-2003.