Zircon Corp. v. Stanley Black & Decker, Inc.

452 F. App'x 966
Court of Appeals for the Federal Circuit·Decided October 5, 2011·No. 2010-1405·Unpublished·Cited by 7 cases

Opinion

O’MALLEY, Circuit Judge.

Zircon Corporation (“Zircon”) alleges that Stanley Black & Decker, Inc. (formerly The Stanley Works) (“Stanley”) infringes United States Patent No. 7,116,091 (“'091 patent”), which discloses a device for ratiometric stud sensing. Zircon appeals the judgment of the United States District Court for the Northern District of California, granting Stanley’s Motion for Summary Judgment of Non-Infringement. The district court granted summary judgment because it construed the term “ratio” to include only division, and it is undisputed that Stanley’s device does not utilize division. Because we find that the district court correctly construed the term “ratio,” determined that there was no literal infringement, and that the disclosure-dedication rule barred infringement under the doctrine of equivalents, we affirm the judgment of the district court.

BACKGROUND

A. Factual Background

This dispute involves the alleged infringement of a patent disclosing a product commonly known as a “stud finder.” As the name suggests, these electronic devices are generally used to locate a stud (i.e., a structural member of a building to which an interior wall surface is affixed) behind the surface of a wall. '091 patent col.l 11.5-20. Zircon, the owner of the '091 patent, alleges that Stanley’s Stud Sensor 200 and FatMax® Stud Sensor 400 infringe both the patented device and method disclosed in the patent. The key issue on appeal centers on whether the '091 patent claims a method of and an apparatus for sensing studs using subtraction, or only by using division.

*968 1. The'091 Patent

Zircon’s '091 patent discloses an “electronic studsensor used to detect center-lines and edges of wall studs, floor joists, and the like.” 1 Id. at col.l 11.10-12. To detect studs, the invention employs a radiometric capacitive sensor that uses capacitive measurements from multiple conductive plates to determine the presence of a stud behind the surface of a wall. 2 Id. at col.4 11.30-35. The presence of a stud behind a wall changes the dielectric constants measured by the conductive plates. Id. at col.l 11.32-33. Measuring these changes enables detection of studs.

All of the claims of the '091 patent disclose either a method or a device using at least two conductive plates to measure fluctuations in dielectric constants. To locate a stud using two conductive plates, “[e]aeh conductive plate acts as part of a separate capacitor.” Id. at col.4 11.35-36. Circuitry coupled to each plate measures the effective change in capacity of the separate capacitors, “while the sensor is moved along the wall surface.” Id. at col.l 11.33-34. The capacitance of a wall covering an underlying stud is larger than that of a wall not covering an underlying stud. Id. at col.4 11.39-42. In light of this fact, as the sensor is moved along the wall, “[t]he capacitance measurement from one plate may then be compared to a capacitance measurement of another plate to determine boundaries and features of the materials in the vicinity of the plates.” Id. at col.411.42-46.

The patent discloses various methods for comparing the capacitances of the two plates to determine whether the sensor is over a stud’s centerline or edge. For example, describing figure 5A, the specification explains that:

In some embodiments, capacitance measurements are used to calculate a ratio. A first capacitance measurement represents the change in capacitance from a minimum value experienced on a first plate 301. A second capacitance measurement represents the change in capacitance from a minimum value experienced on a second plate 302. A ratio between the first and second capacitance measurements may be computed. If the ratio is approximately equal to a predetermined value, it may be determined that a centerline 304 of the sensor 300 is centered over an edge 102 of a stud 100. If the capacitance measurements are equal or the ratio is approximately equal to unity, both plates may be centered over the stud’s edge 102 and the center-line 304 of the sensor 300 may be centered over the centerline 101 of the stud 100.

Id. eol.7 11.20-34. Furthermore, “in accordance with the present invention[,] [t]his ratio may be computed as the smaller capacitance divided by the larger capacitance, thereby resulting in a ratio that is equal to or less than one.” Id. at col.7 11.50-52.

In contrast to this method employing division, the patent’s specification also discloses a method that utilizes subtraction to determine whether the sensor is positioned over the centerline of a stud. Describing Figure 12, the specification explains that:

*969 The comparison circuit 414 may determine whether the capacitive measurements are within a predetermined value of each other.... For example, [the] comparison circuit 414 may determine that the sensor 300 is centered over a stud 100 by detecting that the capacitance measurements are equal to each other and also above a floor threshold.

Id. at eol.14 11.48-63. With respect to the '091 patent, “[cjapacitance measurements may be considered equal when they are within a predetermined percentage value or absolute value from each other.” Id. at col.14 11.64-66 (emphasis added). This reference to “an absolute value from each other” indicates subtraction. These alternate methods of comparing the measured capacitances are crucial to this appeal because every independent claim of the '091 patent claims either “computing” or “generating” a “ratio of the first and second capacitances.” E.g., id. at claim 10.

In addition to the specification, the prosecution history of the '091 patent also discusses both the division and subtraction methods of comparing capacitances. The '091 patent issued from U.S. Patent Application No. 10/794,356 (“'356 application”). J.A. 493-558. Original independent claim 21 of the '356 application recited “comparing the first and second capacitances.” J.A. 219. The remaining independent claims of the '356 application all recited either computing or generating “a ratio of the first and second capacitances.” E.g., J.A. 217, 220, 222. The '356 application, therefore, distinguished between the general function of “comparing” and the specific “ratio” function.

Similarly, claims 22 and 23 of the '356 application, which were dependent upon claim 21, clarified that “comparing” denoted both the ratio and the subtraction methods. Specifically, claim 22 stated that claim 21’s comparing function was performed by “computing a ratio between the first and second capacitances,” — i.e., by using division. J.A. 219. Conversely, claim 23 performed claim 21’s comparison by “determining whether the first and second capacitances differ by less than a threshold,” — i.e., by using subtraction. J.A. 219-20. Thus, the original claims of the '356 application made clear that the generic term “comparing” denoted both the division method and the subtraction method, while “computing a ratio” only referred to the former.

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Zircon Corp. v. Stanley Black & Decker, Inc., 452 F. App'x 966 (Fed. Cir. 2011).

452 F. App'x 966 (Zircon Corp. v. Stanley Black & Decker, Inc.) — published by Counsel Stack Legal Research, free access to 12M+ legal documents.

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