Applied Materials, Inc. v. Demaray LLC

CourtDistrict Court, N.D. California
DecidedMay 9, 2023
Docket5:20-cv-09341
StatusUnknown

This text of Applied Materials, Inc. v. Demaray LLC (Applied Materials, Inc. v. Demaray LLC) is published on Counsel Stack Legal Research, covering District Court, N.D. California primary law. Counsel Stack provides free access to over 12 million legal documents including statutes, case law, regulations, and constitutions.

Bluebook
Applied Materials, Inc. v. Demaray LLC, (N.D. Cal. 2023).

Opinion

1 2 3 4 UNITED STATES DISTRICT COURT 5 NORTHERN DISTRICT OF CALIFORNIA 6 SAN JOSE DIVISION 7 8 APPLIED MATERIALS, INC., Case No. 20-cv-09341-EJD

9 Plaintiff, ORDER ON CLAIM CONSTRUCTION

v. 10

11 DEMARAY LLC, Defendant. 12

13 14 Plaintiff Applied Materials, Inc. (“Applied Materials” or “Applied”) brought this suit 15 against Defendant Demaray LLC (“Demaray”) seeking a declaration of non-infringement of U.S. 16 Patent Nos. 7,381,657 and 7,544,276. ECF Nos. 1 (“Compl.”), 1-15 (the “‘657 Patent”), 1-16 (the 17 “‘276 Patent” and, with the ‘657 Patent, the “Patents-in-Suit”). Demaray countersued for a 18 declaration of validity and infringement of the Patents-in-Suit, and Applied Materials brought a 19 counterclaim for a declaration of invalidity for the same Patents-in-Suit. ECF Nos. 174, 180. The 20 parties dispute the proper construction of five terms used in the claims in the Patents-in-Suit. The 21 Court held a technology tutorial and claim construction hearing on April 26, 2023. Upon 22 consideration of the claims, specifications, prosecution histories, and other relevant evidence, as 23 well as the parties’ written submissions and oral arguments, the court rules as follows. 24 I. BACKGROUND 25 The two Patents-in-Suit share the title “Biased Pulse DC Reactive Sputtering of Oxide 26 Films”; the ‘276 Patent claims are apparatus claims and the ‘657 Patent claims are method claims. 27 The invention here concerns a way to deposit thin films of materials, such as metals, onto a 1 surface, such as a silicon wafer. ‘657 Patent, col. 2:45-62. Such deposition has uses for 2 || producing semiconductor devices and—given the “increasing prevalence of fiber optic 3 communications”—optical devices. /d. at col. 1:15—23. It is desirable to precisely control 4 || properties of the deposited films, such as the index of refraction, physical and chemical 5 uniformity, low stress, and high density. Jd. at col. 1:53—2:2. 6 To that end, the Patents-in-Suit present a “sputtering reactor apparatus” that includes a 7 “pulsed DC power supply coupled through a filter to a target and a substrate electrode coupled to 8 || an RF [ie., radio frequency] power supply,” with a “substrate mounted on the substrate electrode 9 [that] is therefore supplied with a bias from the RF power supply.” Jd. at col. 2:45—54; ‘276 10 || Patent, col. 2:45—-53. The Patents-in-Suit share a Figure 1A, which “show[s] a pulsed DC 11 sputtering reactor according to the present invention”: a 12 ee 15 14 © 14 53 15

16 54 16 10 17 Vv

Z 18 19 18 20 = 21 FIG. 1A 22 || ‘657 Patent, sheet 1 of 27, col. 3:28-30; ‘276 Patent, sheet 1 of 27, col. 3:26-27. Pulsed DC 23 power is sent from a power source (component 14) is sent through a narrow band rejection filter 24 (15) to a target (12), which creates a plasma (53) that is deposited onto a substrate (16) that is 25 || mounted upon a substrate electrode (17). ‘276 Patent, col 5:19-39. RF power from a power 26 source (18) is applied to the substrate (16), id.; as explained during the technology tutorial, this 27 application increases both the rate of deposition of the target material onto the substrate and the 28 || Case No.: 20-cv-09341-EJD ORDER ON CLAIM CONSTRUCTION

1 uniformity of the deposited layer. The narrow band rejection filter prevents the RF power from 2 reaching the pulsed DC power, which might damage the pulsed DC power supply. ‘657 Patent, 3 col. 5:56–57. As explained at the tutorial, a negative charge buildup on the target from the DC 4 power may “poison” the target or cause undesirable arcing that damages the film layer deposited 5 on the substrate, and a positive pulse discharges that buildup. See also id. at col. 5:36–41. 6 II. LEGAL STANDARDS 7 Claim construction is a question of law to be decided by the court. Markman v. Westview 8 Instruments, Inc., 52 F.3d 967, 979 (Fed. Cir. 1995) (en banc), aff’d 517 U.S. 370 (1996). Patent 9 claims are construed in the manner that “most naturally aligns with the patent's description of the 10 invention.” Phillips v. AWH Corp., 415 F.3d 1303, 1316 (Fed. Cir. 2005) (quoting Renishaw PLC 11 v. Marposs Societa’ per Azioni, 158 F.3d 1243, 1250 (Fed. Cir. 1998)). 12 “It is a ‘bedrock principle’ of patent law that ‘the claims of a patent define the invention to 13 which the patentee is entitled the right to exclude.’” Phillips, 415 F.3d at 1312 (citation omitted). 14 Claim construction should begin with “the language of the asserted claim itself.” Comark 15 Commc’ns, Inc. v. Harris Corp., 156 F.3d 1182, 1186 (Fed. Cir. 1998) (citations omitted). A 16 disputed claim term should be construed in a manner consistent with its “ordinary and customary 17 meaning,” which is “the meaning that the term would have to a person of ordinary skill in the art 18 in question.” Phillips, 415 F.3d at 1312–13. Additionally, the use of the term in other claims may 19 provide guidance regarding its proper construction. Id. at 1314. 20 “Because a patent is a fully integrated written instrument, [courts] have long emphasized 21 the importance of the specification in claim construction.” David Netzer Consulting Eng’r LLC v. 22 Shell Oil Co., 824 F.3d 989, 993 (Fed. Cir. 2016) (citation omitted). It is “the single best guide to 23 the meaning of a disputed term.” Phillips, 415 F.3d at 1315 (citing Vitronics Corp. v. 24 Conceptronic, Inc., 90 F.3d 1576, 1582 (Fed. Cir. 1996)). A construction that imposes limitations 25 not found in the claims is erroneous unless it is supported by an unambiguous restriction 26 elsewhere in the intrinsic record. In these circumstances, “the inventor’s intention, as expressed in 27 the specification, is regarded as dispositive.” Id. at 1316. 1 A final source of intrinsic evidence is the prosecution record and any statements made by 2 the patentee to the United States Patent and Trademark Office regarding the scope of the 3 invention. See Phillips, 415 F.3d at 1317 (“Like the specification, the prosecution history 4 provides evidence of how the PTO and the inventor understood the patent.”); Markman, 52 F.3d at 5 980 (“The court has broad power to look as a matter of law to the prosecution history of the patent 6 in order to ascertain the true meaning of language used in the patent claims.”). Because the 7 prosecution history reflects an ongoing negotiation between the patentee and the USPTO, 8 however, it often is difficult to determine with exact precision the scope or meaning of particular 9 statements. Phillips, 415 F.3d at 1317. Thus, the prosecution history usually is accorded less 10 weight than the claims and the specification. Id. Further, any limitation or disclaimer of claim 11 scope based on prosecution history must constitute “unmistakable [and] unambiguous evidence of 12 disclaimer.” Omega Eng’g, Inc. v. Raytek Corp., 334 F.3d 1314, 1325 (Fed. Cir. 2003) (internal 13 citations omitted). 14 The court also may consider extrinsic evidence, such as dictionaries or technical treatises, 15 especially if such sources are “helpful in determining the true meaning of language used in the 16 patent claims.” Phillips, 415 F.3d at 1318 (internal quotations omitted).

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Applied Materials, Inc. v. Demaray LLC, Counsel Stack Legal Research, https://law.counselstack.com/opinion/applied-materials-inc-v-demaray-llc-cand-2023.