Zircon Corp. v. Stanley Works

713 F. Supp. 2d 881, 2010 U.S. Dist. LEXIS 47958, 2010 WL 1957395
CourtDistrict Court, N.D. California
DecidedMay 14, 2010
DocketC-09-0042-EDL
StatusPublished
Cited by2 cases

This text of 713 F. Supp. 2d 881 (Zircon Corp. v. Stanley Works) is published on Counsel Stack Legal Research, covering District Court, N.D. California primary law. Counsel Stack provides free access to over 12 million legal documents including statutes, case law, regulations, and constitutions.

Bluebook
Zircon Corp. v. Stanley Works, 713 F. Supp. 2d 881, 2010 U.S. Dist. LEXIS 47958, 2010 WL 1957395 (N.D. Cal. 2010).

Opinion

ORDER CONSTRUING CLAIM TERM AND GRANTING MOTION FOR SUMMARY JUDGMENT OF NON-INFRINGEMENT

ELIZABETH D. LAPORTE, United States Magistrate Judge.

Defendant The Stanley Works (“Stanley”) moves for Summary Judgment of Non-Infringement of Plaintiff Zircon Corporation’s (“Zircon”) U.S. Patent No. 7,116,091 (the “'091 Patent”), which discloses a device for “ratiometric stud sensing.” The parties agree that the entire matter may potentially be decided as a matter of law based on application of the properly construed claim term “ratio” to the accused device. Defendant also contends that summary judgment of non-infringement can be granted based on the theories of disclosure-dedication and prosecution history estoppel. Having considered the parties’ respective arguments, the Court construes the term “ratio” as “a *885 result of dividing two values” and GRANTS summary judgment of no literal infringement based on this construction. Additionally, summary judgment of non-infringement under the doctrine of equivalents is warranted based on prosecution history estoppel, and the theory of disclosure-dedication.

I. Background

A. The '091 Patent Claims

This case relates to electronic “stud-finders,” which are used for locating studs (i.e., structural members of a building to which an interior wall surface is affixed) or other objects hidden behind a wall surface. See Kiersz Decl. Ex. A ('091 Patent) at 1:14-29. Stud-finders typically use capacitance sensors that measure a change in capacitance due to a change in the “dielectric constant” as the sensor is moved along the wall surface and encounters a stud. Id. at 1:30-36; see also Clay Laster, The Beginner’s Handbook of Amateur Radio 91-93 (3d ed.1994) (attached as Gikkas Decl., Ex. F) (capacitance is “the ability to store an electrical charge in a dielectric or insulating material”).

Zircon’s '091 Patent, entitled “Ratiometric Stud Sensing,” discloses an “electronic stud-sensor used to detect centerlines and edges of wall studs, floor joists, and the like.” '091 Patent at 1:10-12. To accomplish this, the invention includes a radiometric capacitive sensor which may use “capacitive measurements from multiple conductive plates” to determine the presence of objects hidden behind a covering surface. Id. at 4:30-33. The sensor has circuitry .coupled to each plate which “measures an effective change in capacity of the separate capacitors, which is effected by the density of the material in close proximity to the plates.” Id. at 4:36-39. The “capacitance measurement from one plate may then be compared to a capacitance measurement of another plate to determine boundaries and features of materials in the vicinity of the plates.” Id. at 4:43-46. The patent specification discloses various methods for comparing the capacitances of two plates to determine a stud centerline or edge.

For example, the '091 Patent specification discloses a method by which the invention computes a “ratio between the first and second capacitance measurements” to find the centerline of a stud. Id. at 7:25-27. Specifically, some embodiments calculate a ratio between the measurements of the first and second plates, and if the measurements are equal or the ratio is approximately equal to “unity,” (i.e., one), the stud-finder may be centered over the centerline of the stud. Id. at 7:20-34 (“In some embodiments, capacitance measurements are used to calculate a ratio.... A ratio between the first and second capacitance measurements may be computed If the capacitance measurements are equal or the ratio is approximately equal to unity, both plates may be centered over the stud’s edge and the centerline of the sensor may be centered over the centerline of the stud.”) (internal diagram numbering omitted). Additionally, the '091 Patent discloses the comparison of a “transition ratio” to a “calculated ratio” to determine the edge of a stud. Id. at 7:62-8:38. A transition ratio “predicts a capacitance ratio formed at an edge of a stud when the sensor is centered over the stud’s edge for a particular wall structure.” Id. at 7:65-8:1. “A transition ratio can be determined in a number of ways. The transition ratio may be a factory set constant. A transition ratio may be set by an operator. In some embodiments, the transition ratio is calculated during operation.” Id. at 8:4-8.

Stanley distinguishes the “ratio” method described above, which Stanley contends is a division method, from what it views as a second method for comparison disclosed in *886 the patent specification — a subtraction method — whereby the first and second capacitance measurements are subtracted from each other, and the device is centered when the measurements are equal to each other (i.e., “within an ... absolute value from each other.”) Id. at 14:50-66 (“comparison circuit may determine that the sensor is centered over a stud by detecting that the capacitance measurements are equal to each other and also above a floor threshold. Capacitance measurements may be considered equal when they are within a predetermined percentage value or absolute value from each other”).

Every independent claim of the '091 Patent claims “computing” or “generating” “a ratio of the first and second capacitances.” See id. at 20:64, 21:42, 21:57, 22:62-63, 23:57-58, 24:31, and 24:49-50. None of the independent claims expressly provide an alternative method of subtraction to compare capacitance measurements. Stanley therefore contends that the specification discloses both the division and subtraction methods, but fails to claim the subtraction method, and the claim term “ratio” should be construed as limited to a method of division to compare capacitance measurements in the patent claims, and not encompassing a method whereby capacitance measurements are subtracted from one another. Zircon counters that the '091 patent discloses and claims both a division and subtraction method for comparing capacitance measurements because the claim term “ratio” should be more broadly construed to encompass subtraction as well as division.

B. Prosecution History of the '091 Patent

The '091 Patent issued from U.S. Patent Application No. 10/794,356 (the “'356 Application”). The original independent claim 1 of the '356 Application disclosed a method of “computing a ratio of the first and second capacitances” to find a feature behind a surface. Kiersz- Decl. Ex. C at S039. The original independent claim 21 of the '356 Application recited more generally “comparing the first and second capacitances.” Kiersz Decl. Ex. C at S041. Original dependent claims 23 and 24 (dependent on claim 21) further specified alternative ways in which the capacitances could be compared to find the centerline of a stud: either by “determining whether the first and second capacitances differ by less than a threshold” (original claim 23) or “computing a ratio between the first and second capacitances” (original claim 24). Id. at S041-42. 1

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Bluebook (online)
713 F. Supp. 2d 881, 2010 U.S. Dist. LEXIS 47958, 2010 WL 1957395, Counsel Stack Legal Research, https://law.counselstack.com/opinion/zircon-corp-v-stanley-works-cand-2010.