Loral Fairchild Corp. v. Victor Co. of Japan, Ltd.

931 F. Supp. 1014, 1996 U.S. Dist. LEXIS 14204, 1996 WL 402622
District Court, E.D. New York·Decided July 12, 1996·No. Civil Action 92-0128-ARR, 91-5056-ARR·Published·Cited by 10 cases

Opinion

OPINION

RADER, Circuit Judge (Sitting by Designation).

In this patent ease, Loral Fairchild Corporation sued numerous Japanese electronics companies for infringement of United States Patents 3,931,674 (the ’674 patent) and 3,896,485 (the ’485 patent). In August 1995, the court severed and stayed all of the non-manufacturing consumer defendants, leaving six core groups of manufacturing defendants — Sony, Sanyo, Toshiba, Hitachi, NEC, and OKI. On October 11, 1995, the court ordered separate trials for each of the six groups of manufacturing defendants and scheduled trial dates for each.

Over the course of five weeks in January and February, 1996, Loral Fairchild Corporation (Loral) and Sony Electronics, Inc. and Sony Corporation (Sony) tried the issues of ownership, validity, and infringement of the two patents to a jury. On February 14,1996, the jury returned a verdict finding that Loral owns the patents, that Sony did not prove invalidity of the asserted claims, and that Loral had proven infringement. The jury also found that Sony induced infringement of the ’674 patent but did not induce infringement of the ’485 patent. After the verdict, Sony moved for judgment as a matter of law (JMOL) or for a new trial.

Loral and Sony then tried the remaining liability issues to the court on April 15 and 16,1996. This Opinion is the court’s decision on Sony’s post-trial motion as well as the court’s findings of fact and conclusions of law on prosecution history estoppel, equitable es-toppel, and laches.

Because no reasonable jury could find that Sony infringed the two patents, this court grants Sony’s motion for judgment as a matter of law. In addition, this court finds prosecution history estoppel prevents Loral from asserting the doctrine of equivalents to cover Sony’s accused products. However, this court finds that neither equitable estop-pel nor laches bar recovery in this suit.

BACKGROUND

This court has issued several opinions in this case which discuss the technology, the patents, and the claims. See Loral Fairchild Corp. v. Victor Co. of Japan, 911 F.Supp. 76 (E.D.N.Y.1996) (imposing discovery sanction); Loral Fairchild Corp. v. Victor Co. of Japan, 906 F.Supp. 813 (E.D.N.Y.1995) (granting defendants’ motion for summary judgment on marking); Loral Fairchild Corp. v. Victor Co. of Japan, 906 F.Supp. 798 (E.D.N.Y.1995) (construing disputed claims of the patents). This opinion builds on the foundation of those earlier decisions. This opinion assumes familiarity with those preceding decisions.

The ’485 Patent

Claim 1 of the ’485 patent reads:

Structure which comprises:
a. a light sensing element comprising a first region of semiconductor material overlaid by a first electrode separated from said semiconductor material by insulation, said light sensing element being capable of containing a charge packet;
b. an adjacent region of said semiconductor material disposed for receiving said charge packet from said light sensing element;
*1019 c. means for controlling the transfer of said charge packet from said light sensing element to said adjacent regions; and,
d. charge sink means having a contact for applying a bias thereto buried within said semiconductor material and disposed for receiving excess charge accumulated in said light sensing element, said charge sink means extending laterally from said contact toward said light sensing element while beneath the surface of said semiconductor material.

This court interpreted the disputed portions of this claim language. Loral, 906 F.Supp. at 807-12. Summarizing this court’s detailed claim construction, “charge sink means” describes a means-plus-function limitation. In accord with the specification, this court determined that the charge sink means is a region of semiconductor material doped opposite from its surrounding semiconductor material. The charge sink means does not include its associated depletion region. Thus, the charge sink means is a separate and distinct structure within the semiconductor substrate.

Claim 1 also provides a description of the location of this structure. The language identifies the “charge sink means” structure as “buried within said semi-conductor material.” Further the claim places this structure “beneath the surface of said semi-conductor material.” The “buried within” and “beneath the surface” language means the charge sink structure is surrounded by and submerged within the semiconductor material.

This court construed “contact” to mean one or more electrical paths for charge to flow to and from the charge sink means. Lastly, this court interpreted the phrase “extending laterally from said contact toward the light sensing element” as conveying more information about the location of the charge sink structure. This directional language requires the charge sink structure to stretch from the contact toward the light sensing element. Thus, this buried structure extends parallel to the semiconductor’s top surface and perpendicular from a contact toward the light sensing element. Figure 1 of the ’486 patent provides an excellent depiction of the location of the charge sink structure.

During the course of the claim construction trial, the court heard extensive testimony about the reasons for a “buried” charge sink means. Semiconductor devices sense light with a structure that converts light waves into electrical charges. The light sensing element in the device, however, has a certain charge capacity. Intense light can cause the element to exceed its capacity causing excess charge to spill out of the light sensing structure and flow into adjacent light sensing elements.. The result of this overflow is blooming — a spreading distortion of light on .the detected image. To prevent blooming, the chip includes a structure to capture and dissipate excess charge from the light sensing elements. These charge capturing devices prevent the excess charge from spilling over into adjacent light sensing elements. Initially, chip designers placed these charge drains next to the light sensing elements on the surface of the chips. See C.H. Sequin, Blooming Suppression in Charge Coupled Area Imaging Devices, The Bell System Technical Journal, October 1972; United States Patent 3,866,067. However, surface drains occupied valuable light sensing space on the surface of the chip. To achieve higher resolution in light detection, designers sought to remove charge drains from the chip surface leaving more room for light sensors. Early’s ’485 patent represents a step toward solving this problem by placing a drain structure below the surface of the chip to capture the excess charge below the light sensing element. [See Transcript of September 19, 1995, Hearing, at 32-33]. Consequently, the claims of the ’485 patent cover a structure entirely beneath the surface of the chip.

After construing the claims, the court invited the parties to renew motions for summary judgment on the asserted claims of the ’485 patent. The court granted Sony’s motion for summary judgment of no literal infringement. However, the court denied the motion on the issue of infringement under the doctrine of equivalents.

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Loral Fairchild Corp. v. Victor Co. of Japan, Ltd., 931 F. Supp. 1014, 1996 U.S. Dist. LEXIS 14204, 1996 WL 402622 (E.D.N.Y. 1996).

931 F. Supp. 1014 (Loral Fairchild Corp. v. Victor Co. of Japan, Ltd.) — published by Counsel Stack Legal Research, free access to 12M+ legal documents.

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